Li Feng, Tan Chao*, Dong Feng, Jia Jiabin, V-Net deep imaging method for electrical resistance tomography, IEEE Sensors Journal, 2020(JUN), Vol.20, No.12, pp.1558-1748. (DOI: 10.1109/JSEN.2020.2973337)
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上一条:Liu Hao, Tan Chao*, Zhao Shu, Dong Feng, Nonlinear ultrasonic transmissive tomography for low contrast biphasic medium imaging using continuous-wave excitation, IEEE Transactions on Industrial Electronics, 2020(OCT), Vol.67, No.10, pp. 8878-8888. (DOI: 10.1109/TIE.2019.2949531)
下一条:Zhang Wei, Tan Chao*, Dong Feng, Dual-modality tomography by ERT and UTT projection sorting algorithm, IEEE Sensors Journal, 2020(MAY), Vol.20, No.10, pp. 5415-5423. (DOI: 10.1109/JSEN.2020.2969529)
