天津大学教师个人主页系统董峰 Tan Chao, Xu Yaoyuan, Dong Feng*, Determining the boundary of inclusions with known conductivities using a Levenberg–Marquardt algorithm by electrical resistance tomography, Measurement Science and Technology, 2011(OCT), Vol.22, No.10, pp. 104005 (13pp). (DOI:10.1088/0957-0233/22/10/104005) 董峰

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DONG Feng

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School of Electrical and Information Engineering

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Professor

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Control Science and Engineering

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Journal Papers (in English)

Current position: 董峰 > Publications > Journal Papers (in English)

Tan Chao, Xu Yaoyuan, Dong Feng*, Determining the boundary of inclusions with known conductivities using a Levenberg–Marquardt algorithm by electrical resistance tomography, Measurement Science and Technology, 2011(OCT), Vol.22, No.10, pp. 104005 (13pp). (DOI:10.1088/0957-0233/22/10/104005)

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Pre One:Dong Feng*, Xu Cong, Zhang Zhiqiang, Ren Shangjie, Design of parallel electrical resistance tomography system for measuring multiphase flow, Chinese Journal of Chemical Engineering, 2012(APR), Vol.20, No. 2, pp.368-379. (DOI: 10.1016/S1004-9541(12)60400-5)

Next One:Wang Hongyi, Dong Feng*, Bian Yuchen, Tan Chao, Improved Correlation for the Volume of Bubble Formed in Air-Water System, Chinese Journal of Chemical Engineering, 2011(JUN), Vol.19, No.3, pp529-532. (DOI: 10.1016/S1004-9541(11)60017-7)