Hu Chunguang

School

School of Precision Instrument and Optoelectronics Engineering

Professional Title

Professor

Discipline

仪器科学与技术(Instrument Science and Technology)

Other Contact Information

Selected Papers

Current position: English > Academic Achievements > Selected Papers

C.G. Hu*, S.C. Huo, W.F. Shen, Y.N. Li, X.T. Hu. Reflectance difference microscopy for nanometre thickness microstructure measurements. Journal of Microscopy, 2018, 270(3): 318-325.

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