天津大学教师个人主页系统金建勋 J.X. Jin, S.X. Dou, H.K. Liu, T. Hardono, C. Cook, and C. Grantham, “Critical current degradation caused by winding process of Bi-2223/Ag HTS wire in the form of a coil”, IEEE Transactions on Applied Superconductivity, Vol. 9, No. 2, pp. 138-141, 1999. Personal Profile

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JIN JIANXUN

School

School of Electrical and Information Engineering

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Professor

Discipline

Applied Superconductivity and Electromagnetics

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Selected Papers

Current position: Personal Profile > Academic Achievements > Selected Papers

J.X. Jin, S.X. Dou, H.K. Liu, T. Hardono, C. Cook, and C. Grantham, “Critical current degradation caused by winding process of Bi-2223/Ag HTS wire in the form of a coil”, IEEE Transactions on Applied Superconductivity, Vol. 9, No. 2, pp. 138-141, 1999.

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Pre One:J.X. Jin, S.X. Dou, T. Hardono, and C. Cook, “Novel ac loss measurement of high Tc superconducting long wire”, Physica C, Vol. 314, pp. 285-290, 1999.

Next One:J.X. Jin, and S.X. Dou, “Development of high Tc superconductors for engineering applications”, Science and Technology Advancing into New Millennium, People’s Education Press, China, Eds. J.H. Sun, et al, pp. 368-382 (English version), and pp. 581-585 (Chinese version) (1999). (ISBN 7-107-13208-3)