王瀚

School

School of Microelectronics

Professional Title

Associate professor

Discipline

电子科学与技术、多媒体信息处理

Other Contact Information

Selected Papers

Current position: Home > Academic Achievements > Selected Papers

D. Yu, H. Wang*, and J. Xu, “Impact of Worst-Case Excitation for DDR interface Signal and Power Integrity Co-Simulation,” Journal of Electronic Testing: Theory and Applications (JETTA), vol. 36, no. 3, pp. 365–374, 2020, doi: 10.1007/s10836-020-05875-4.

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