天津大学教师个人主页系统仇巍 Qiu W, Cheng C L, Liang R R, et al. Measurement of residual stress in a multi-layer semiconductor heterostructure by micro-Raman spectroscopy[J]. Acta Mechanica Sinica, 2016, 32(5): 805-812. Personal Profile

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Qiu Wei

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School of Mechanical Engineering

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Professor

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Current position: Personal Profile > Academic Achievements > Selected Papers

Qiu W, Cheng C L, Liang R R, et al. Measurement of residual stress in a multi-layer semiconductor heterostructure by micro-Raman spectroscopy[J]. Acta Mechanica Sinica, 2016, 32(5): 805-812.

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Pre One:Xie H M, Qiu W*, Song H B, et al. In situ measurement of the deformation and elastic modulus evolution in Si composite electrodes during electrochemical lithiation and delithiation[J]. Journal of the Electrochemical Society, 2016, 163(13): A2685-A2690.

Next One:Li Q, Ge Y, Tan X H, Yu Q, Qiu W*. Experiment research on deformation mechanism of CNT film material [J]. Journal of Nanomaterials, 2016, 2016.