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(SCI 三区) Li Zhang, Xia Xiao(肖夏)*, Haiyang Qi, Yiting Huang, Huiquan Qin, Quantitative and nondestructive determination of residual stress for SiO2 thin film by laser-generated surface acoustic wave technique, Measurement Science and Technology, 33(4), 045601, 2022.

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Title of Paper:(SCI 三区) Li Zhang, Xia Xiao(肖夏)*, Haiyang Qi, Yiting Huang, Huiquan Qin, Quantitative and nondestructive determination of residual stress for SiO2 thin film by laser-generated surface acoustic wave technique, Measurement Science and Technology, 33(4), 045601, 2022.

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