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表面波評価装置,日本发明专利,日本国特许厅,公开号:JP2004-286594, 公开时间:2004-10-14,授权号:3876316,授权时间:2006-11-10.

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Service Invention or Not:no

Pre One:结构改进型压电信号探测器, 中国发明专利, ZL2009103075102, 申请日:2009-09-28, 授权日:2011-05-04.