天津大学教师个人主页系统杨成娟 [9] Zhu JJ, Tian YL, Yang CJ*, Wang FJ, Liu XP.: Lithography-induced wettability Changes of Silicon. 2017 IEEE International Conference on Manipulation, Manufacturing and Measurement on the Nanoscale (3M-NANO), August 7-11, 2017, Shanghai, China. Personal Profile

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Yang Chengjuan

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[9] Zhu JJ, Tian YL, Yang CJ*, Wang FJ, Liu XP.: Lithography-induced wettability Changes of Silicon. 2017 IEEE International Conference on Manipulation, Manufacturing and Measurement on the Nanoscale (3M-NANO), August 7-11, 2017, Shanghai, China.

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Next One:[8] Yang CJ*, Yang Z, Tian YL, Liu XP.: Effects of picosecond laser power variation on laser-induced changes of titanium. 2016 IEEE International Conference on Manipulation, Manufacturing and Measurement on the Nanoscale (IEEE 3M-NANO 2016), July 18-22, 2016, Chongqing, China, 149-154.