M. Li, Q. -J. Zhang, F. Feng*, Z. Li, T. He, S. Zhong, K. Ma, "A Scalable Knowledge-Based Neural Network Model for GaN HEMTs With Accurate Trapping and Self-Heating Effects Characterization," IEEE Transactions on Microwave Theory and Techniques, early access, Jan. 2023.

Release time:2023-05-10  Hits:

• Translation or Not:no
• CN No.:null