天津大学教师个人主页系统高卫国 Gao, Weiguo; Zhang, Dawei; Qi, Xiangyang; Cui, Liangyu; Niu, Wentie; Shen, Yu. Test tig for thermal errors of spindle under simulated running load. Application Date: 2010.09.26, Authorized Date: 2012.07.04, China, Patent Number: ZL 201010292289.0 Personal Profile

中文

Brief Introduction
Education Background
Research Interests
Courses
Professional Membership
Positions & Employments
Academic achievements
Honors & Awards
Team
Album

gao weiguo

School

School of Mechanical Engineering

Professional Title

Associate professor

Administrative Appointments

Vice Dean

Discipline

Mechinical Engineering

Other Contact Information

Patents

Current position: Personal Profile > Academic Achievements > Patents

Gao, Weiguo; Zhang, Dawei; Qi, Xiangyang; Cui, Liangyu; Niu, Wentie; Shen, Yu. Test tig for thermal errors of spindle under simulated running load. Application Date: 2010.09.26, Authorized Date: 2012.07.04, China, Patent Number: ZL 201010292289.0

Hits:

Service Invention or Not:no

Pre One:Gao, Weiguo; Zhang, Dawei; Qi, Xiangyang; Cui, Liangyu; Zhang, Hongjie; Shen, Yu. Test methods for thermal errors of spindle under simulated running load. Application Date: 2010.09.26, Authorized Date: 2011.11.09, China, Patent Number: ZL 201010292286.7