王瀚
Gender:Male
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Pre One:D. Yu, H. Wang*, and J. Xu, “Impact of Worst-Case Excitation for DDR interface Signal and Power Integrity Co-Simulation”, Journal of Electronic Testing: Theory and Applications (JETTA), vol. 36, no. 3, pp. 365–374, 2020, doi: 10.1007/s10836-020-05875-4.
Next One:J. Xu, F. Li, L. Han*, Z. Gao, and H. Wang, “Analysis of signal attenuation in global shutter CMOS image sensor”, Microelectronics Reliability, vol. 109, June 2020, doi: 10.1016/j.microrel.2020.113678.