D. Yu, H. Wang*, and J. Xu, “Impact of Worst-Case Excitation for DDR interface Signal and Power Integrity Co-Simulation”, Journal of Electronic Testing: Theory and Applications (JETTA), vol. 36, no. 3, pp. 365–374, 2020, doi: 10.1007/s10836-020-05875-4.
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上一条:J. Xu, K. Lu, X. Shi, S. Qin, H. Wang*, and J. Ma, “A DenseUnet generative adversarial network for near-infrared face image colorization”, Signal Processing, vol. 183, p. 108007, June 2021, doi: 10.1016/j.sigpro.2021.108007.
下一条:J. Xu, X. Shi, S. Qin, K. Lu, H. Wang*, and J. Ma, “LBP-BEGAN: A generative adversarial network architecture for infrared and visible image fusion”, Infrared Physics and Technology, vol. 104, no. 11, p. 103144, 2020, doi: 10.1016/j.infrared.2019.103144.
