天津大学教师个人主页系统王健 S. Zhou and J. Wang, "An RF Stress-Based Thermal Shock Test Method for a CMOS Power Amplifier," IEEE Journal of the Electron Devices Society, vol. 9, pp. 1024-1029, 2021, doi: 10.1109/JEDS.2021.3121132. 中文主页

天津大学网站

官网

English

English

更多

王健

教师拼音名称：Wang Jian
出生日期：1979-08-07
性别：男
所属院系：微电子学院

论文成果

Current position:: 中文主页 >> 学术成就 >> 论文成果

S. Zhou and J. Wang, "An RF Stress-Based Thermal Shock Test Method for a CMOS Power Amplifier," IEEE Journal of the Electron Devices Society, vol. 9, pp. 1024-1029, 2021, doi: 10.1109/JEDS.2021.3121132.

点击次数:

是否译文:否
CN号:null

上一条:C. Yang, J. Wang and J. Ma, "Exploration of X-Band Communication for Maritime Applications in the South China Sea," in IEEE Antennas and Wireless Propagation Letters, vol. 21, no. 3, pp. 481-485, March 2022, doi: 10.1109/LAWP.2021.3136044.