Shih Ni Ong, Kiat Seng Yeo, K.W.J. Chew, and L.H.K. Chan, “Substrate-Induced Noise Model and Parameter Extraction for High-Frequency Noise Modeling of Sub-Micron MOSFETs,” IEEE Transactions on Microwave Theory and Techniques, vol.62, no.9, pp.1973-1985, September 2014.
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上一条:Xi Sung Loo, Kiat Seng Yeo, and K.W.J. Chew, “THRU-Based Cascade De-Embedding Technique for OnWafer Characterization of RF CMOS Devices,” IEEE Transactions on Electron Devices, vol.60, no.9, pp.2892- 2899, September 2013.
下一条:H.K. Chan, Kiat Seng Yeo, K.W.J. Chew, and Shih Ni Ong, “High-Frequency Noise Modeling of MOSFETs for Ultra Low-Voltage RF Applications,” IEEE Transactions on Microwave Theory and Techniques, vol.63, no.1, pp.141-154, January 2015.
