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上一条:[13] X.Y. Wang, H. Zhang, X.P. Ma et al，Degradation behavior and mechanism of polymer films for high-ohmic resistor protection in a heat and humid environment. Microelectronics Reliability, 57 (2016) 79–85. 下一条:[15] X.Y. Wang, J.X. Ma, C.G. Li et al, Structure and electrical properties of quaternary Cr-Si-Ni-W films prepared by ion beam sputter deposition. Journal of Alloys and Compounds，604(2014)12–19.