7. Jun-Jie Gu，Hai-Peng Fu，Wei-Cong Na，Qi-Jun Zhang，Jian-Guo Ma, “Fast and Automated Electromigration Analysis for CMOS RF PA Design,” Journal of Electronic Testing-Theory and Applications, vol. 33, no. 1, pp. 133-140, 2017.
点击次数:
上一条:8. Qian Lin, Hai-Peng Fu, Qian-Fu Cheng, and Yuan-Yuan Zhu, “Study of the index failure for power amplifier caused by temperature,” Analog Integrated Circuits and Signal Processing, vol. 89, no. 1, pp. 177-183, 2016.
下一条:6. Yuan-Yuan Zhu, Jian-Guo Ma, Hai-Peng Fu, Qi-Jun Zhang, Qian-Fu Cheng and Qian Lin, “Accurate modeling of pHEMT output current derivaties over a wide temperature range,” International Journal of Numerical Modeling: Electronic Networks, Devices and Fields, vol. 30, no. 3-4, 2017.
