Zhang Wei, Tan Chao*, Xu Yanbin, Dong Feng, Electrical resistance tomography image reconstruction based on modified OMP algorithm, IEEE Sensors Journal, 2019(JUL), Vol.19, No.4, pp.5723-5731. (DOI: 10.1109/JSEN.2019.2906264)
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上一条:Xiao Zhili, Tan Chao*, Dong Feng, Three-dimensional hemorrhage imaging by cambered magnetic induction tomography, IEEE Transactions on Instrumentation and Measurement, 2019(JUL), Vol.68, No.7, pp.2460-2468. (DOI: 10.1109/TIM.2019.2900779)
下一条:Xu Yanbin, Zhang Shengnan, Wang Zheng, Dong Feng*, A fast iterative updated thresholding algorithm with sparsity constrains for electrical resistance tomography, Measurement Science and Technology, 2019(JUL), Vol.30, No.7, pp.074001(14pp.). (DOI: 10.1088/1361-6501/ab16aa)
