Xu Yanbin, Zhang Shengnan, Wang Zheng, Dong Feng*, A fast iterative updated thresholding algorithm with sparsity constrains for electrical resistance tomography, Measurement Science and Technology, 2019(JUL), Vol.30, No.7, pp.074001(14pp.). (DOI: 10.1088/1361-6501/ab16aa)
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上一条:Zhang Wei, Tan Chao*, Xu Yanbin, Dong Feng, Electrical resistance tomography image reconstruction based on modified OMP algorithm, IEEE Sensors Journal, 2019(JUL), Vol.19, No.4, pp.5723-5731. (DOI: 10.1109/JSEN.2019.2906264)
下一条:Wang Yu, Ren Shangjie*, Dong Feng, Focusing sensor design for open electrical impedance tomography based on shape conformal transformation, Sensors, 2019(MAY), Vol.19, No.9, pp.2060(22p). (DOI: 10.3390/s19092060)
