TAN Chao

School

School of Electrical and Information Engineering

Professional Title

Professor

Administrative Appointments

Dean

Other Contact Information

Selected Papers

Current position: Chao TAN > Academic Achievements > Selected Papers

Li Feng, Tan Chao*, Dong Feng, Jia Jiabin, V-Net Deep Imaging Method for Electrical Resistance Tomography, IEEE Sensors Journal, 2020 June, Vol. 20, No. 12, pp.6460-6469. (SCI ) (10.1109/JSEN.2020.2973337)

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