天津大学教师个人主页系统兰馗博 Open circuit defect positioning method based on dynamic photon emission microscopy and schematic analysis for mixed signal IC on SOI Personal Profile

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Lan Kuibo

School

School of Microelectronics

Professional Title

Engineer

Discipline

微电子学与固体电子学

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Selected Papers

Current position: Personal Profile > Academic Achievements > Selected Papers

Open circuit defect positioning method based on dynamic photon emission microscopy and schematic analysis for mixed signal IC on SOI

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