天津大学教师个人主页系统聂斌 Statistical Process Analysis and Control of Semiconductor Manufacturing Personal Profile

中文

Brief Introduction
Education Background
Research Interests
Courses
Professional Membership
Positions & Employments
Academic achievements
Honors & Awards
Team
Album

Nie Bin

School

College of Management and Economics

Other Contact Information

Selected Papers

Current position: Personal Profile > Academic Achievements > Selected Papers

Statistical Process Analysis and Control of Semiconductor Manufacturing

Hits:

Journal: Industrial Engineering

Translation or Not:no

Pre One:“CASH: A New SPC Scheme Based on Cluster Analysis in Excess Variety”

Next One:Modified individual control chart based on particle filter