• Papers

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• [1] Statistical process control based on state space model
• [2] Highly Automatic Mechanical Manufacturing Process Control
• • [3]  A clustering approach to distinguish the change-point.
  • [4] Multiple-response surface approach: modeling and optimization. 
  • [5] Fault Prediction of Automatic Mechanical Equipment based on Yield Management
  • [6] “CASH: A New SPC Scheme Based on Cluster Analysis in Excess Variety”
  • [7] Statistical Process Analysis and Control of Semiconductor Manufacturing
  • [8] Modified individual control chart based on particle filter
  • [9] Manufacturing Process Yield Management Framework Based on Data Mining