Qiang Liu

School

School of Microelectronics

Professional Title

Professor

Discipline

电子科学与技术

Other Contact Information

Selected Papers

Current position: Personal Profile > Academic Achievements > Selected Papers

Q. Liu, L. Guo and H. Tang, "Fault Model Analysis of DRAM under Electromagnetic Fault Injection Attack," 2023 Design, Automation & Test in Europe Conference & Exhibition (DATE), Antwerp, Belgium, 2023, pp. 1-6, doi: 10.23919/DATE56975.2023.10137146.

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