Li Feng, Tan Chao*, Dong Feng, Jia Jiabin, V-Net Deep Imaging Method for Electrical Resistance Tomography, IEEE Sensors Journal, 2020 June, Vol. 20, No. 12, pp.6460-6469. (SCI ) (10.1109/JSEN.2020.2973337)
点击次数:
上一条:Chen Yixuan, Tan Chao*, Dong Feng, Combined Planar Magnetic Induction Tomography for Local Detection of Intracranial Hemorrhage, IEEE Transactions on Instrumentation and Measurement, 2020, online. (10.1109/TIM.2020.3011621)
下一条:Zhang Wei, Tan Chao*, Dong Feng, Dual-modality Tomography by ERT and UTT Projection Sorting Algorithm, IEEE Sensors Journal, 2020 May 15, Vol.20, No.10, pp. 5415-5423 (SCI ) (10.1109/JSEN.2020.2969529)
