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Xu JiangTao

School

School of Microelectronics

Professional Title

Professor

Administrative Appointments

微电子学院副院长

Discipline

Microelectronics

Other Contact Information

Selected Papers

Current position: 徐江涛的主页 > Academic Achievements > Selected Papers

A Method to Reduce the Effect on Image Quality Caused by Resistance of Column Bus

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Affiliation of Author(s):Tianjin University

Journal:IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS

All the Authors:Jiangtao Xu* ; Wei Li; Kaiming Nie; Liqiang Han; Xiyang Zhao

First Author:Jiangtao Xu

Indexed by:Unit Twenty Basic Research

Correspondence Author:Jiangtao Xu

Volume:27

Issue:173-181

Translation or Not:no

CN No.:null

Pre One:Long Exposure Time Noise in Pinned Photodiode CMOS Image Sensors

Next One:Analysis of Transfer Gate Doping Profile Influence on Dark Current and FWC in CMOS Image Sensors

Address: No. 92, Weijin Road, Nankai District, Tianjin Zip Code: 300072

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