Language
中文
Mobile

Xu JiangTao

School

School of Microelectronics

Professional Title

Professor

Administrative Appointments

微电子学院副院长

Discipline

Microelectronics

Other Contact Information

Selected Papers

Current position: 徐江涛的主页 > Academic Achievements > Selected Papers

Analysis of Transfer Gate Doping Profile Influence on Dark Current and FWC in CMOS Image Sensors

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Journal:EEE Journal of the Electron Devices Society

All the Authors:Jiangtao Xu；Quanmin Chen；Zhiyuan Gao

First Author:Jiangtao Xu

Indexed by:Unit Twenty Basic Research

Correspondence Author:Zhiyuan Gao

Volume:9

Page Number:27-35

Translation or Not:no

CN No.:null

Pre One:A Method to Reduce the Effect on Image Quality Caused by Resistance of Column Bus

Next One:Pixel Parameters Optimization in PWM Image Sensor for Quantization Error Suppression

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