Xu Zongwei

Professor

Gender:Male

Selected Papers

Current position:: Zongwei Xu in TJU > Academic Achievements > Selected Papers

Depth Profiling of Ion-Implanted 4H–SiC Using Confocal Raman Spectroscopy

Release time:2022-12-21 Hits:

Journal:Crystals

Translation or Not:no

CN No.:null

Pre One:Raman Characterization of Carrier Concentrations of Al-implanted 4H-SiC with Low Carrier Concentration by Photo-Generated Carrier Effect

Next One:Electron paramagnetic resonance characterization of aluminum ion implantation-induced defects in 4H-SiC

Click:

The Last Update Time:..

Home 中文