Mainly engaged in the preparation and characterization of microelectronics metal film and dielectric film; in the preparation and electrical characteristics improvement of one dimensional conductive materials. Chip failure analysis and reliability research.

As participants completed two national natural science fund (Great interconnection scale integrated circuit carbon nanotubes and key technology research, project number: 60806030; Resistance of carbon nanotube electrodes cross array variable storage unit and switch characteristic research, project number: 61274113), One key projects of Tianjin science and technology plan (Directional carbon nanotubes vertical interconnect integrated circuit technology research, project number: 10SYSYJC27700).